Semiconductor + FPD/OLED/PCB

Ultrapure & High-Purity Water Systems for Semiconductor, FPD, OLED & PCB — 18.2 MΩ·cm, SEMI F63 / IPC-9592

Two-pass RO + EDI + mixed-bed polish + 185 nm UV for wafer fabs (18.2 MΩ·cm), and RO → EDI → sub-loop polish for display & PCB cleaning (10–16 MΩ·cm). Built for wafer fabs, advanced packaging, OLED/LCD, and compound-semiconductor lines. Capacities from 0.5 t/h lab pilot to 100 t/h production trains.

Request a UPW Sizing Sheet Talk to a semiconductor engineer
SEMI F63 / ASTM D5127 E1.218.2 MΩ·cm validatedIPC-9592 / E2–E3 for FPD/PCB0.5–100 t/h
semiconductor application — water treatment equipment detail
Process water system — key stage
semiconductor application — process component
System component in operation
semiconductor application — process component
Process detail view
semiconductor client / installation site visit
On-site / client visit
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Why Semiconductor Fabs Cannot Tolerate Anything Less Than 18.2 MΩ·cm

A single 0.1 µm particle or 1 ppb TOC excursion can scrap an entire lot of EUV-patterned wafers. We engineer to SEMI F63 and ASTM D5127-13 Type E1.1 / E1.2, sized to hold these numbers during transient demand — not just at steady state.

What you measureWhy it mattersTarget we hold
ResistivityTotal ionic contamination18.2 MΩ·cm @ 25 °C
TOCPhotoresist defects< 5 ppb (online)
ParticlesPattern defects< 1/mL @ ≥ 0.05 µm
SilicaDeposits on wafer< 0.5 ppb
Bacteria / endotoxinYield killer< 1 CFU/L

Our Standard UPW Process Train

StageEquipmentFunctionKey spec
③ 1st-pass RODOW™ BW30-400Remove 95–99% ionsRecovery 75–80%
④ 2nd-pass RODOW™ BW30-4040Push to < 5 µS/cmRecovery 90%
⑤ EDIVeolia / Suez / QKH-EDIContinuous ion removal15–18 MΩ·cm
⑥ Mixed-bed polisherNuclear-grade MBFinal polish to 18.2 MΩ·cmMB life 12–18 months
⑦ 185 nm UVTOC reductionPhoto-oxidise residual TOC≥ 30 mJ/cm²
⑨ LoopEP 316L SS / PVDF / PFAHold resistivity at point-of-useRa ≤ 0.8 µm, 1.5–2 m/s

Overall recovery 85–90%, with reject routed to UPW reclaim and scrubber make-up.

Materials We Use

Wetted partMaterialSurface finish
RO vesselsFRP with vinyl ester liner
Distribution pipingElectropolished 316L SS / PVDF / PFARa ≤ 0.8 µm
TanksHDPE-lined CS / PP / PVDFNo metal contact
ValvesSanitary diaphragm, EPDM/PTFENo dead legs
WeldsOrbital, argon-purgedPassivation ASTM A967

Standard Capacities

ModelOutputPowerTypical application
UPW-0.50.5 t/h4 kWR&D / lab pilot
UPW-22 t/h12 kWPilot line, OLED R&D
UPW-55 t/h25 kWSmall-batch fab
UPW-1010 t/h50 kW6"/8" fab
UPW-2020 t/h95 kW8"/12" fab
UPW-5050 t/h220 kW12" advanced fab
UPW-100CustomCustomMega-fab

Engineering Reference — 50 t/h UPW for a 12" Wafer Fab

Engineering reference design for this capacity class. The actual shipped project is summarised on our About page under NDA.
ParameterDesign value
FeedCity water, TDS ≈ 200 ppm, silica ≈ 8 ppm
UPW demand50 t/h, 1.3× peak factor
Loop1.8 m/s, 3× tank turnover/h
UPW quality18.2 MΩ·cm, TOC < 5 ppb, particles < 1/mL
RO / EDITwo-pass 85% recovery; two EDI trains 25 t/h each
DistributionEP 316L SS, Ra ≤ 0.8 µm, PFA-lined final 20 m
ControlsSiemens S7-1500, Profinet to fab SCADA, optional SECS/GEM
Delivery18–22 weeks from PO

For FPD, OLED & PCB Lines — High-Purity Water, Not Full UPW

Most display and board fabricators do not need 18.2 MΩ·cm. FPD color-filter washing, OLED evaporation-chamber cleaning and PCB rinse/etch lines are correctly spec'd to 10–16 MΩ·cm cleaning water plus a separate, lower-grade process loop. Specifying full UPW where it is not needed costs roughly 30–50% extra capex and 40–60% higher operating cost for no yield gain — we engineer to the right spec for the line.

What you measureWhy it mattersTarget we hold
Resistivity (cleaning)Ionic residue on glass / wafer / PCB10–16 MΩ·cm @ 25 °C
TOC (cleaning)Streaking on display, hazing on glass< 50 ppb (online)
ParticlesDisplay mura, PCB solder defects< 10/mL @ ≥ 0.1 µm
SilicaGlass staining< 5 ppb
BacteriaBiofilm in sub-loop< 10 CFU/L
Process loop (etch/CMP)Recirculated for reclaim1–5 MΩ·cm depending on stage

Most FPD and Gen-6+ OLED lines do not need mixed-bed polishers in the main loop — EDI + 185 nm UV + sub-loop tank holds ~15 MΩ·cm at point-of-use. We add MB polish only when a single demanding tool (e.g. EUV-adjacent metrology) or borderline feed water requires it. Optional UF + RO CMP reclaim skid recovers 60–80% of etch/CMP wastewater back to pretreatment.

Engineering Reference — 10 t/h Cleaning Water for a Gen-6 OLED Line

Engineering reference design for this capacity class. Actual delivered electronics projects are summarised on our About page under mutual NDA; full documentation available on request.
ParameterDesign value
FeedCity water, TDS ≈ 200 ppm, silica ≈ 8 ppm, free Cl₂ < 0.5 ppm
Cleaning demand10 t/h avg, 1.4× peak
Cleaning water quality15 MΩ·cm @ point-of-use, TOC < 30 ppb, particles < 5/mL @ ≥ 0.1 µm
Process loop (etch/CMP)2 t/h reclaim via UF + RO, returned to feed
Sub-loopPFA-lined final 15 m, 1.8 m/s, 3× tank turnover/h
ControlsSiemens S7-1500 / Allen-Bradley CompactLogix, Profinet to fab DCS
Delivery12–16 weeks from PO

5 Pitfalls We Design Around

  • TOC excursion during EDI start-up — online TOC on EDI outlet; ramp UPW-to-tools only after TOC < 10 ppb for 24 h.
  • Particle spikes after MB regeneration — pre-test at FAT; 3-day on-site handover.
  • Bacterial growth in the loop — sized ≥ 1.5 m/s with periodic hot sanitisation (≥ 80 °C) and/or ozone.
  • Silica breakthrough on EDI — pre-RO pushes silica below 0.5 ppm; checked in pre-engineering.
  • MB lifetime wasted on CO₂ absorption — N₂ blanket and HEPA vent filters keep MB life at 12–18 months.
  • Over-spec to full UPW when 10–16 MΩ·cm is enough (FPD/OLED/PCB) — we ask for the line's most demanding point-of-use first, then size back. UPW-only quotes on display lines cost buyers 30–50% more for no yield gain.

Standards We Design To

  • SEMI F63 — UPW for semiconductor processing
  • ASTM D5127-13 — Type E1.1 / E1.2 (wafer UPW) and E2 / E3 (display/PCB cleaning water)
  • IPC-9592 — Water quality for PCB manufacturing
  • ASTM D5128 — On-line TOC analysis
  • ISO 14644-3 — Cleanroom compatibility
  • CE / IEC 61010 / IEC 61326
  • ISO 9001 / ISO 14001

Frequently Asked Questions

Q1. What resistivity can your UPW system actually hold?

For wafer fabs, 18.2 MΩ·cm at point-of-use, validated at FAT and on-site SAT. For FPD / OLED / PCB cleaning lines we hold 10–16 MΩ·cm — spec'd to the line's real requirement so you are not paying for UPW you do not need. Mixed-bed polisher sized for 12–18 months between regenerations.

Q2. Can you integrate with our fab SCADA / MES?

Yes — Modbus TCP / Profinet / EtherNet/IP standard; optional SECS/GEM (SEMI E30/E84/E87).

Q3. How long does delivery + installation take?

12–14 weeks for ≤ 20 t/h; 18–22 weeks for 50 t/h. On-site installation 3–4 weeks for a 20 t/h skid.

Q4. What feed water do you accept?

Potable city water TDS ≤ 500 ppm. Surface/river/seawater needs a UF pretreatment skid.

Q5. Do you provide IQ/OQ documentation?

Yes — full IQ/OQ/PQ in English, FAT in our factory, SAT at your site, material traceability (3.1 certs) and calibration certificates.

Q6. What is the warranty?

12 months on the whole system + 36 months on critical parts (RO membranes, EDI stacks, UV lamps).

Q7. Do you supply consumables and spares?

Yes — 2-year consumables forecast; standard spares stocked in our Shenzhen warehouse for 7-day international dispatch.

Q8. Can we visit your factory for a FAT?

Yes — customer FATs at our Shenzhen facility, or remote video FAT.

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Technical content reviewed by Ella Liu, Industrial Water Treatment Specialist at Rong Water — 10+ years sizing RO, EDI and ultrapure / high-purity water systems for semiconductor, display (FPD/OLED) and electronics clients.

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